The observance of the Brownian motion of particles in a suspension with the aid of dynamic light scattering (DLS) allows the particle size determination down to the lower nanometer range.

Based on this principle the Nano Particle Sizer ANALYSETTE 12 DynaSizer is ideal for particle size measurements down into the lower nanometer range.

The most important parameters: 1 nm – 6000 nm measuring range, slightest sample quantities are needed and a wide concentration range of 0.0003 – 40 Vol.-%.

Even difficult samples are no problem! Due to the cuvette-free design and the innovative ultra-thin layer technology the thickness of the sample layer is variably adjustable: If an ultra thin analysis layer is selected,  samples with a high particle concentrations as well as dark solvents, like ink and oil can be measured, unwanted multiple-scattering or the heating of the medium through the absorption of laser light can be drastically reduced. You can increase with a simple turn the thickness of the analysis layer and due to the high laser power (which is variable adjustable) and the very sensitive detector, even systems with lowest particle concentrations can be measured.

Smallest sample quantities of 50 µl – 5 ml are sufficient for measurements. The sample can be introduced directly from the pipette into the instrument – making cuvettes completely obsolete. Due to this design, the sample can be directly diluted in the measuring cell or substances, which cause certain reactions, can be simply added. The observance of particle size changes based on such reactions with passing time is then easily possible.

Due to the well-conceived design of the measurement system, the ANALYSETTE 12 is fast and comfortable to clean and immediately ready for the next measurement.

The powerful Padé-Laplace algorithm (amongst others) is available for analysis. Combined with the multi-acquisition mode complete particle size distributions can be determined. And for newcomers to dynamic light scattering the provided simulation module offers possibilities for quickly exploring the potential of the measurement process.